System-On-Chip Test Architectures
Nanometer Design for Testability
System-On-Chip Test Architectures: Nanometer Design for Testability
Publisher: Morgan Kaufmann
Type: Physical Book
Language: English
Pages: 893
Release Date: 2007-11-01
ISBN 10: 0080556809
ISBN 13: 9780080556802
Readers: 1
Country: United States of America
Data Score: 1790