Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
Publisher: Springer
Type: Physical Book
Language: English
Pages: 321
Information: Third Edition
Release Date: 2009-11-01
ISBN 10: 3319998242
ISBN 13: 9783319998244
Country: United States of America
Data Score: 1800