Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials

Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

2003 • 321 pages
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials

Publisher: Springer

Type: Physical Book

Language: English

Pages: 258

Information: Softcover reprint of hardcover 2nd ed. 2010

Release Date: 2009-11-01

ISBN 10: 3642264786

ISBN 13: 9783642264788

Country: United States of America

Data Score: 1800